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Olympus Vanta GX XRF Precious Metals Analyzer

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$4,875.00

Enhance your precious metal testing process with the Olympus Vanta GX XRF Precious Metals Analyzer. Contact us today for pricing, availability, and worldwide shipping options.

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Olympus Vanta GX XRF Precious Metals Analyzer for Sale – Advanced Gold & Jewelry Testing Device

The Olympus Vanta GX XRF Precious Metals Analyzer is a fast, accurate, and easy-to-use desktop analyzer designed for precious metal testing, jewelry verification, bullion analysis, and scrap metal identification. Ideal for jewelers, pawn shops, gold buyers, refiners, and precious metal dealers, this advanced XRF system delivers reliable results within seconds in a safe, closed-beam environment.

Using advanced X-ray fluorescence (XRF) technology, the Vanta GX accurately detects and analyzes up to 27 elements, including gold (Au), silver (Ag), platinum (Pt), palladium (Pd), rhodium (Rh), and copper (Cu). The analyzer quickly provides metal composition, karat values, and plating alerts to help identify counterfeit or plated items with confidence.

Its compact desktop design, modern touchscreen interface, and integrated color camera make it ideal for professional workspaces and customer-facing environments. Built-in safety interlocks and shielding help provide secure operation with no direct operator exposure during normal use.

Key Features
Fast and accurate precious metal analysis in seconds

Detects up to 27 elements including Au, Ag, Pt, Pd, Rh, and Cu

Provides composition analysis, karatage, and plating detection alerts

Safe closed-beam design with integrated safety interlocks

User-friendly color touchscreen with gesture navigation

Integrated full-color camera for sample imaging and reporting

USB and microSD connectivity for saving and exporting data

Compact desktop-ready design for retail and laboratory settings

Included with Purchase
Pre-Owned Olympus Vanta GX Analyzer (SDD or PIN model based on availability)
AC Power Adapter with Wall Plug
USB Cable for PC Connection
Spare XRF Windows

Technical Specifications
Detector Type: Silicon Drift Detector (SDD) or Silicon PIN Diode (PIN)
X-ray Tube: 2 W, 35 kV, 50 µA max, Tungsten (W) anode
Spot Size: 6 mm nominal diameter
Display: 800 × 480 WVGA capacitive touchscreen
Camera: Integrated full-color VGA camera
Operating System: Linux with Evident proprietary software
Sample Chamber Dimensions: 9.39 × 17.67 × 17.34 cm (3.70 × 6.96 × 6.83 in.)
Unit Dimensions Closed: 35.73 × 23.93 × 32.41 cm (14.07 × 9.42 × 12.76 in.)
Unit Dimensions Open: 38.78 × 23.93 × 39.08 cm (15.27 × 9.42 × 15.39 in.)
Weight: 10 kg (22 lbs)
Power Requirements: 100–240 VAC, 50–60 Hz, 70 W
Connectivity: 2 × USB ports, 1 × mini USB, 1 × microSD card slot
Operating Temperature: -10 °C to 40 °C (14 °F to 122 °F)
Humidity Range: 10% to 90% RH, non-condensing

Typical Applications
Gold and silver buying
Jewelry authentication
Coin and bullion testing
Scrap metal analysis
Detection of counterfeit and plated items
Precious metal recycling and refining

This product uses X-ray fluorescence (XRF) technology and should only be operated according to manufacturer safety guidelines. Integrated shielding and safety interlocks are designed to minimize operator exposure during normal use. Users should follow all applicable local regulations, training requirements, and safe operating procedures when using XRF equipment.

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